LEO XB1540

FIB XP800 (FEI Corporation)

• Focused Ion Beam
• Spinstand
• Scanning Near-field Optical Microscopy
• Scanning Probe Microscopy (AFM, STM, MFM,...)
• Optical Lithography
• Optical Kerr Magnetometry
• Superconducting Magnetometry
• Vibrating Sample Magnetometry
• BH-looper
• Deposition Systems